A1485
Title: Optimal Design and Reliability Sampling Plans for One-Shot Devices under Multiple-Stress Generalized Exponential Models
Authors: Chien-Tai Lin - Tamkang University (Taiwan) [presenting]
Abstract: We consider optimal experimental design and reliability sampling plans for one-shot devices under a multiple-stress accelerated life-testing model with generalized exponential lifetimes subject to a total cost constraint. Inspection schedules are typically constructed using prespecified proportional structures, which impose fixed components in the design configuration and may limit flexibility in implementation. Inspection-time parameters are therefore treated as decision variables within a unified optimization framework. The proposed procedure jointly determines sample allocations and inspection settings and is extended to reliability sampling plans. Numerical results demonstrate improved efficiency and greater flexibility compared with conventional constrained designs.
