A1171
Title: Optimal design for step-stress accelerated life testing with hybrid group censoring for non-destructive one-shot devices
Authors: Man Ho Ling - The Education University of Hong Kong (Hong Kong) [presenting]
Abstract: Step-stress accelerated life tests (SSALTs) have attracted increasing attention from both industry and academia as effective methods for inducing rapid product failures and collecting extensive failure data for reliability analysis. A new framework for optimizing the design of SSALTs with hybrid group censoring is introduced, specifically for non-destructive one-shot devices, all while adhering to budget and time constraints. In this talk, an optimal design of SSALTs using a hybrid group censoring scheme will be discussed. An approach is presented to determine the optimal stopping threshold for an SSALT experiment, providing practitioners with a decision rule for terminating the experiment based on the number of failures observed. The findings demonstrate that this framework is a valuable tool for designing effective SSALTs, enabling the evaluation of mean lifetimes in a cost-effective manner for non-destructive one-shot devices.
