A1047
Title: Optimal designs of multiple step-stress accelerated life tests for one-shot devices
Authors: Man Ho Ling - The Education University of Hong Kong (Hong Kong) [presenting]
Abstract: Step-stress accelerated life tests have become increasingly popular in both industry and academia for quickly inducing product failures and collecting failure data for reliability analysis. The purpose is to discuss an optimal design for step-stress accelerated life testing with multiple stress levels, specifically for one-shot devices intended for single use. The method focuses on determining the best inspection times and how to allocate test items across different stress levels to minimize the variance of the maximum likelihood estimator of reliability at a designated mission time under normal conditions, assuming Weibull lifetime distributions. This framework is a valuable tool for creating efficient step-stress accelerated life tests to assess the reliability of one-shot devices. A case study involving grease-based magnetorheological fluids illustrates the practical application of the optimal design approach.
