Title: Estimation of reliability with semi-parametric frailty modeling of degradation
Authors: Debasis Sengupta - Indian Statistical Institute (India)
Prajamitra Bhuyan - Imperial College London (United Kingdom) [presenting]
Abstract: In many real life scenarios, stress accumulates over time and the system fails as soon as the accumulated stress or degradation equals or exceeds a critical threshold. For some devices, it is possible to obtain measurements of degradation over time, and these measurements may contain useful information about product reliability. We propose a semi-parametric random effect (frailty) model for degradation path, and a method of estimating this path as well as the reliability. Consistency of the estimator under general conditions is established. Simulation results show superiority of the performance of the proposed method over a parametric competitor. The method is illustrated through the analysis of a real data set.