A0965
Title: On reliability analysis of one-shot device testing data with defects
Authors: Man Ho Ling - The Education University of Hong Kong (Hong Kong) [presenting]
Abstract: The problem of defective devices in the manufacturing industry is studied. Defective devices can arise due to a range of reasons, such as errors made by workers, inadequate quality processes, insufficient training, or issues with reliability during the design stage. The focus is on one-shot device test data that includes defects which have occurred during a realistic manufacturing process. In this scenario, the question arises of whether a failed device is actually defective or has simply failed due to its lifetime being shorter than the inspection time. The maximum likelihood approach will be explored to estimate the mean time to failure based on a sample of one-shot devices with manufacturing defects. This will be done using the gamma and Weibull lifetime distributions. How masking can affect the estimation and analysis under different defective rates and masking proportions will also be examined.
