A0930
Title: Planning of an accelerated degradation test
Authors: I-Chen Lee - National Cheng Kung University (Taiwan) [presenting]
Abstract: Accelerated degradation tests (ADTs) are widely used to access the lifetime information of highly reliable products. To obtain a more accurate prediction of lifetime information, how to design an efficient experiment under a limited budget is a critical issue for reliability analysts. Much literature addressed this problem and indicated that a two-level design is an optimum strategy for an ADT plan. Considering easier operating conditions for experimenters, most literature developed the optimum designs under the assumption that the numbers of measurements and the duration between two inspections within a degradation path are equal for all testing stress levels. However, some real applications were conducted under the operating conditions that the numbers of measurements and sampling frequencies were different for all stress levels. Based on the exponential dispersion (ED) degradation model, the optimum planning under various constraints of operating conditions is determined so that the asymptotic variance of a prediction can be minimized.
