A0250
Title: Optimum test planning for heterogeneous Wiener processes
Authors: Chien-Yu Peng - Academia Sinica (Taiwan)
Ya-Shan Cheng - National Tsing Hua University (Taiwan) [presenting]
Abstract: Degradation models based on heterogeneous Wiener processes are commonly used to assess the lifetime information for highly reliable products. In general, an optimum test plan under limited resources is found by numerical methods for the heterogeneous Wiener process. However, the numerical search for optimum test plans can not avoid the time-consuming and locally optimum issues. To overcome these difficulties, an explicit expression is derived for decision variables (such as the termination time, the number of measurements, and sample size) of the D- and V-optimum test plans with cost constraints. The theoretical results not only ensure the globally optimum test plan but also provide clear insights into decision variables affected by the model parameters and experimental costs. Some numerical examples are presented to support the efficiency and applicability of the optimum test plans.
