A0570
Title: Deep learning-based residual control chart for count data
Authors: Jong-Min Kim - University of Minnesota at Morris (United States) [presenting]
Il Do Ha - Pukyong National University (Korea, South)
Abstract: Statistical process control for count data has difficulty overcoming multicollinearity. We propose a new deep learning residual control chart based on the asymmetrical count response variable when there are highly correlated explanatory variables. We implement and compare different methods such as neural network, deep learning, principal component analysis based Poisson regression, principal component analysis based negative binomial regression, nonlinear principal component analysis based Poisson regression, and nonlinear principal component analysis based negative binomial regression in terms of the root mean squared error. Using two asymmetrical simulated datasets generated by the combined multivariate normal, binary and copula functions, the neural network and deep learning have a smaller mean, median, and interquartile range when compared to the principal component analysis based Poisson regression, principal component analysis based negative binomial regression, nonlinear principal component analysis based Poisson regression, and nonlinear principal component analysis based negative binomial regression. We also compare the deep learning and neural network based residual control charts in terms of the average run length with the copula based asymmetrical simulated and real bids number of takeover bids data.
