B0487
Title: Transparent sequential learning for monitoring sequential processes
Authors: Peihua Qiu - University of Florida (United States) [presenting]
Xiulin Xie - Florida State University (United States)
Abstract: A recent statistical process control (SPC) method is presented that extends the self-starting process monitoring idea that has been employed widely in modern SPC research to a general learning framework for monitoring sequential processes with serially correlated data. Under the new framework, process characteristics to learn are well specified in advance, and process learning is sequential in the sense that the learned process characteristics keep being updated during process monitoring. The learned process characteristics are then incorporated into a control chart for detecting process distributional shifts based on all available data by the current observation time. Numerical studies show that process monitoring based on the new learning framework is more reliable and effective than some representative existing machine learning SPC approaches.
