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B0936
Title: J-characteristics for 3-level response surface designs Authors:  Jose Nunez Ares - KU Leuven (Belgium) [presenting]
Peter Goos - Universiteit Antwerpen (Belgium)
Abstract: The quality of two-level orthogonal screening designs is often evaluated by means of J-characteristics. We extend this work to three-level response surface designs, define the J-characteristics of an arbitrary 3-level response surface design, and provide a simple expression that relates the J-characteristics with the design points. An attractive feature of the J-characteristics is that they do not only quantify the degree of aliasing between effects, but also describe the morphology of a design, namely, the pattern of zeros. We use the J-characteristics to revisit some existing results for Orthogonally Minimally Aliased Response Surface Designs. Finally, we define a set of J-characteristics for 3-level response surface designs tailored to the case where a second-order effects model is of interest. Using these tailored J-characteristics, we propose an expression for the resolution and the aberration of 3-level response surface designs and we illustrate its usefulness with a set of 3,246 7-factor RSDs extracted from literature.